IMPACT OF PROCESS VARIATIONS ON SOFT ERROR SENSITIVITY OF 32-NM VLSI CIRCUITS IN NEAR-THRESHOLD REGION By
نویسندگان
چکیده
ACKNOWLEDGMENTS I would like to thank my advisor Dr. William H. Robinson first. I am thankful for the advice he gave me on my research as well as graduate study and the patient guidance. His advice on research and career are important for my future development. In addition, I would like to thank Dr. Bharat L. Bhuva for his thoughtful advice on my thesis work. I also want to thank the SAF-T group for the feedback and help on my research. Last, I would like to thank my family for the continuous support.
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